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University physics experiment instrument

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University physics experiment instrument

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Laser photoelectron

Modern comprehensive

Grating spectrometer

Interference diffraction polarization

Photoelectric element characteristics

Optical holography

Optical measurement

Optical fiber information communication

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Optical measurement

YCL-4 optical nonlinear measuring instrument

YCL-4 optical nonlinear measuring instrument

Nonlinear optics is one of the basis of information optoelectronic and photonic device physics, the instrument uses laser Z scanning technology, the optical path is simple, high sensitivity, direct measurement of open, closed hole and spot information, while measuring nonlinear refractive index and nonlinear absorption coefficient; a variety of detectors for optical signal measurement, the use of computer to achieve automatic control and testing.

YCL-4A ellipsometry thickness gauge

YCL-4A ellipsometry thickness gauge

Manual elliptical polarization thickness gauge uses extinction method to measure film thickness and refractive index, and manually adjusts the polarization and polarization angle during the test. Ellipsometry is widely used in the measurement of dielectric films on solid substrates. Among the existing methods for measuring film thickness, it is the thinnest and highest precision class.

YCL-4B CCD Young's modulus measuring instrument

YCL-4B CCD Young's modulus measuring instrument

CCD Young's modulus measuring instrument uses static tensile method to measure Young's modulus. When a vertical metal wire is stretched by a weight with a mass of M, its length mark decreases with the elongation of the steel wire. The change of the steel wire can be observed by a reading microscope with a minimum dividing value of 0,05. This experimental instrument uses CCD instead of human eyes to observe, and the effect is more intuitive and clearer.

YCL-5 optical power tester

YCL-5 optical power tester

The optical power tester can measure the energy of various laser outputs such as gas lasers, solid-state lasers and fuel lasers in the range of 400nm-1050nm. After calibrating the laser energy of various wavelengths, it can measure the energy of various wavelengths (632.8nm calibration). This light energy tester uses high-quality silicon photodetector to improve the sensitivity of the instrument.

YCL-5A automatic elliptical polarization thickness gauge

YCL-5A automatic elliptical polarization thickness gauge

This elliptical polarization thickness gauge adopts extinction elliptical polarization processing, with high precision and automatic control. The light source adopts He-Ne laser with high wavelength precision. The instrument is connected with a computer through USB interface. The supporting software has various processing methods for sampling data, which is suitable for different needs. The software design is reasonable, suitable for such experimental requirements, convenient to use and simple to operate.

YCL-5B Young's modulus measuring instrument

YCL-5B Young's modulus measuring instrument

Within the elastic limit of an object, the stress is proportional to the strain, and the ratio is called the Young's modulus of the material; it is a physical quantity that characterizes the properties of the material and depends only on the physical properties of the material itself; the size of the Young's modulus indicates the rigidity of the material, and the greater the Young's modulus, the less likely it is to deform. Young's modulus of elasticity is one of the basis for the selection of mechanical parts materials.

YCL-6 optical power tester

YCL-6 optical power tester

The optical power tester uses a high-quality PIN tube as the optical receiver, which improves the sensitivity of the instrument to detect optical radiation by 0.1 μW and can be used as an optical power detection indicator in the band range of 400nm-1100nm. The instrument sets the correction output corresponding to 514nm, 532nm, 632.8nm and 650nm wavelengths.

YCL-13 film thickness gauge

YCL-13 film thickness gauge

This film thickness gauge is developed according to the principle of multiple reflection spectrum coherence. This instrument can provide non-contact measurement of film thickness, refractive index, absorption coefficient, etc. It adopts the latest software version and has the advantages of nano-scale accurate measurement and convenient use. Convenience and accuracy of measurement are better than commonly used optical ellipsometer. It is an indispensable measurement and research instrument for coating research, optical coating and semiconductor production.

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laser photoelectron
modern comprehensive
grating spectrometer
interference diffraction polarization
photoelectric element characteristics
optical holography

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